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Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC Kueck, AM; Kim, Do Kyung; Ramasse, QM; De Jonghe, LC; Ritchie, RO, NANO LETTERS, v.8, pp.2935 - 2939, 2008-09 |
Local Fracture Toughness of Si3N4 Ceramics Measured using Single-Edge Notched Microcantilever Beam Specimens Tatami, Junichi; Katayama, Masaki; Ohnishi, Masahiro; Yahagi, Tsukaho; Takahashi, Takuma; Horiuchi, Takahiro; Yokouchi, Masahiro; et al, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.98, no.3, pp.965 - 971, 2015-03 |
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