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HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SOLID-PHASE CRYSTALLIZED SILICON THIN-FILMS ON SIO2 - CRYSTAL-GROWTH AND DEFECTS FORMATION KIM, JH; Lee, JeongYong; NAM, KS, JOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.95 - 102, 1995-01 |
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