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AUGER-ELECTRON SPECTROSCOPY QUANTITATIVE-ANALYSIS OF INTERFACIAL SIO2 LAYER SOH, JW; Lee, Won-Jong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.34, no.7A, pp.3666 - 3667, 1995-07 |
POISSONS RATIOS VERSUS IONICITIES OF METAL-NONMETAL COMPOUNDS SOH, JW; Lee, HyuckMo, SCRIPTA METALLURGICA ET MATERIALIA, v.27, no.7, pp.783 - 788, 1992-10 |
RELATION BETWEEN POISSONS RATIO AND IONICITY IN SIMPLE BINARY CUBIC COMPOUNDS SOH, JW; Lee, HyuckMo; KWON, HS, JOURNAL OF ALLOYS AND COMPOUNDS, v.194, pp.119 - 125, 1993 |
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