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Showing results 1 to 11 of 11

1
A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon

Choi, Si-Kyung; Kim, YP; Ha, YH; Kim, SH; Kim, HK; Moon, DW, The 2rd international symposium on control of semiconductor interfaces, 1996

2
A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon

Kim, YP; Choi, Si-Kyung; Ha, YH; Kim, Sehun; Kim, HK; Moon, DW, APPLIED SURFACE SCIENCE, v.117, pp.207 - 211, 1997-06

3
A study of the oxidation behavior and the postannealing effect in a graded SiGe/Si heterostructure

Lim, YS; Jeong, JS; Lee, JeongYong; Kim, HS; Shon, HK; Kim, HK; Moon, DW, JOURNAL OF ELECTRONIC MATERIALS, v.31, no.5, pp.529 - 534, 2002-05

4
Direct observation of Si lattice strain and its distribution in the Si(001)-SiO2 interface transition layer

Kim, YP; Choi, Si-Kyung; Kim, HK; Moon, DW, APPLIED PHYSICS LETTERS, v.71, no.24, pp.3504 - 3506, 1997-12

5
Dry thermal oxidation of a graded SiGe layer

Lim, YS; Jeong, JS; Lee, JeongYong; Kim, HS; Shon, HK; Kim, HK; Moon, DW, APPLIED PHYSICS LETTERS, v.79, no.22, pp.3606 - 3608, 2001-11

6
Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopy

Moon, DW; Ha, YH; Kim, HK; Kim, KJ; Kim, HS; Lee, JeongYong; Kim, Sehun, APPLIED SURFACE SCIENCE, v.150, no.1-4, pp.235 - 243, 1999-08

7
Strain-induced anisotropic Ge diffusion in SiGe/Si superlattices

Lim, YS; Lee, JeongYong; Kim, HS; Moon, DW, APPLIED PHYSICS LETTERS, v.80, no.14, pp.2481 - 2483, 2002-04

8
Strain-induced diffusion in a strained Si1-xGex/Si heterostructure

Lim, YS; Lee, JeongYong; Kim, HS; Moon, DW, APPLIED PHYSICS LETTERS, v.77, no.25, pp.4157 - 4159, 2000-12

9
Strain-induced diffusion in strained SiGe/Si heterostructures

Lim, YS; Lee, Jeong Yong; Kim, HS; Moon, DW, Growth, Evolution and Properties of Surfaces, Thin Films and Self-Organized Strutures, v.648, pp.369 - 370, 2000-11-27

10
The electronic energy loss of 100 keV heavy ions in medium energy ion scattering analysis of a Ta2O5 ultrathin film

Moon, DW; Kim, HK; Kim, YP; Ha, YH; Choi, Si-Kyung; Kim, Sehun, NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.125, no.1-4, pp.120 - 123, 1997-04

11
저에너지 저 도즈의 산소 이온 주입에 의한 SIMOX SOI구조의 제조

최시경; Kim, YP; Bae,YH; Kweon, YK; Kim, YK; Moon, DW, 제2회 반도체 학술대회, pp.131 -, 1995

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