Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Kweon, SY
Showing results 1 to 13 of 13
| Ferroelectric properties of lead-free (Bi,La)(4)Ti3O12 thin film deposited on MTP cell structure for high density FeRAM device Cho, KW; Kim, NK; Oh, SH; Choi, ES; Sun, HJ; Yeom, SJ; Lee, KN; et al, ECO-MATERIALS PROCESSING DESIGN VI BOOK SERIES: MATERIALS SCIENCE FORUM, v.486-487, pp.285 - 288, 2005 |
| Identification of microstructure reaction products in active filler metal/alumina brazement Choi, Si-Kyung; Kweon, SY; Cho, YJ, 일본 세라믹 협회, 1992 |
| Intrinsic stress dependence of c-axis orientation ratio in PbTiO3 thin films deposited by reactive sputtering Kweon, SY; Yi, SH; Choi, Si-Kyung, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.15, no.1, pp.57 - 61, 1997-01 |
| Platinum (100) hillock growth in Pt/Ti electrode stack for SrBi2Ta2O3 ferroelectric random access memory Choi, Si-Kyung; Jung, WW; Kweon, SY; Yeom, SJ, International Conference on Electroceramics, pp.164 -, 2003 |
| Platinum (100) hillock growth in Pt/Ti electrode stack for SrBi2Ta2O9 ferroelectric random access memory Jung, WW; Choi, Si-Kyung; Kweon, SY; Yeom, SJ, JOURNAL OF ELECTROCERAMICS, v.13, no.1-3, pp.55 - 63, 2004-07 |
| Platinum hillocks in Pt/Ti film stacks deposited on thermally oxidized Si substrate Kweon, SY; Choi, Si-Kyung; Yeom, SJ; Roh, JS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.10, pp.5850 - 5855, 2001-10 |
| Platinum(100) hillock growth in a Pt/Ti electrode stack for ferroelectric random access memory Jung, WW; Choi, Si-Kyung; Kweon, SY; Yeom, SJ, APPLIED PHYSICS LETTERS, v.83, no.11, pp.2160 - 2162, 2003-09 |
| Pre-annealing effects on al metallization properties in high density FeRAM device Cho, KW; Choi, JH; Yu, HS; Kweon, SY; Yeom, SJ; Kim, NK; Choi, ES; et al, INTEGRATED FERROELECTRICS, v.81, pp.113 - 122, 2006 |
| Prediction of Residual Stress-Induced Cracking by Finite Element Analysis 최시경; Kweon, SY, 한국요업학회, pp.90 -, 1994 |
| Stacked Pt/SrBi2Ta2-xNbxO9/Pt/IrOx/Ir capacitor on poly plug Kweon, SY; Choi, Si-Kyung; Yang, WS; Yeom, SJ; Roh, JS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.1, pp.66 - 69, 2002-01 |
| Stress dependence of orientation ratio and microstructure in PbTi03 thin film deposited by reactive sputtering 최시경; Kweon, SY, 한국요업학회, pp.50 -, 1996 |
| Surface characterization of diamond films polished by thermomechanical polishing method Choi, Si-Kyung; Jung, DY; Kweon, SY; Jung, SK, THIN SOLID FILMS, v.279, no.1-2, pp.110 - 114, 1996-06 |
| Thermal stability and electrical properties of SrBi2Ta2-xNbxO9/IrOx capacitors with Pt top electrode Kweon, SY; Choi, Si-Kyung; Yang, WS; Yeom, SJ; Roh, JS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.9A, pp.5275 - 5280, 2001-09 |
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