Showing results 1 to 8 of 8
A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon Choi, Si-Kyung; Kim, YP; Ha, YH; Kim, SH; Kim, HK; Moon, DW, The 2rd international symposium on control of semiconductor interfaces, 1996 |
A medium energy ion scattering analysis of the Si-SiO2 interface formed by ion beam oxidation of silicon Kim, YP; Choi, Si-Kyung; Ha, YH; Kim, Sehun; Kim, HK; Moon, DW, APPLIED SURFACE SCIENCE, v.117, pp.207 - 211, 1997-06 |
Direct observation of Si lattice strain and its distribution in the Si(001)-SiO2 interface transition layer Kim, YP; Choi, Si-Kyung; Kim, HK; Moon, DW, APPLIED PHYSICS LETTERS, v.71, no.24, pp.3504 - 3506, 1997-12 |
Effects of Deformation-induced Twinning and Martensitic Transformation on the Cryogenic Machanical Properties of Fe-19Mn-5Cr-(0-5)Al-0.2C Alloys Hong, Soon-Hyung; Oh, BW; Cho, SJ; Kim, YG; Kim, WJ; Kim, YP, Plenum Press, Advanced in Cryogenic Engineering, pp.1183 - 1190, 1994-01-01 |
Enhanced densification of liquid-phase-sintered WC-Co by use of coarse WC powder: Experimental support for the pore-filling theory Kim, YP; Jung, SW; Kang, Suk-Joong L; Kim, BK, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.88, pp.2106 - 2109, 2005-08 |
The electronic energy loss of 100 keV heavy ions in medium energy ion scattering analysis of a Ta2O5 ultrathin film Moon, DW; Kim, HK; Kim, YP; Ha, YH; Choi, Si-Kyung; Kim, Sehun, NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, v.125, no.1-4, pp.120 - 123, 1997-04 |
산소 이온 빔에 의한 실리콘 산화과정의 in situ MEIS분석 최시경; Kim, YP; Choi, SK; Ha, YH; Kim, SH; Kim, HK, 한국진공학회, 1996 |
저에너지 저 도즈의 산소 이온 주입에 의한 SIMOX SOI구조의 제조 최시경; Kim, YP; Bae,YH; Kweon, YK; Kim, YK; Moon, DW, 제2회 반도체 학술대회, pp.131 -, 1995 |
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