Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Ji, Kwang Hwan
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| Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With SiNx and SiO2 Gate Dielectrics Ji, Kwang Hwan; Kim, Ji-In; Mo, Yeon-Gon; Jeong, Jong Han; Yang, Shinhyuk; Hwang, Chi-Sun; Park, Sang-Hee Ko; et al, IEEE ELECTRON DEVICE LETTERS, v.31, no.12, pp.1404 - 1406, 2010-12 |
| Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment Yang, Shinhyuk; Ji, Kwang Hwan; Kim, Un Ki; Hwang, Cheol Seong; Park, Sang-Hee Ko; Hwang, Chi-Sun; Jang, Jin; et al, APPLIED PHYSICS LETTERS, v.99, no.10, 2011-09 |
| Trench-Structured High-Current-Driving Aluminum-Doped Indium-Tin-Zinc Oxide Semiconductor Thin-Film Transistor Kim, Do Hyung; Lee, Kwang-Heum; Lee, Seung Hee; Kim, Junsung; Yang, Junghoon; Kim, Jingyu; Cho, Seong-In; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.10, pp.1677 - 1680, 2022-10 |
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