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Failure of exchange-biased low resistance magnetic tunneling junctions upon thermal treatment Lee, JH; Jeong, HD; Kyung, H; Yoon, CS; Kim, CK; Park, Byong Guk; Lee, Taek Dong, JOURNAL OF APPLIED PHYSICS, v.91, no.1, pp.217 - 220, 2002-01 |
Interdiffusion in antiferromagnetic/ferromagnetic exchange coupled NiFe/IrMn/CoFe multilayer Lee, JH; Jeong, HD; Yoon, CS; Kim, CK; Park, Byong Guk; Lee, Taek Dong, JOURNAL OF APPLIED PHYSICS, v.91, no.3, pp.1431 - 1435, 2002-02 |
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