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Effect of Sb addition in Sn-Ag-Cu solder balls on the drop test reliability of BGA packages with Electroless Nickel Immersion Gold (ENIG) surface finish Park, YS; Kwon, YM; Son, HY; Moon, JT; Jeong, BW; Kang, KI; Paik, Kyung-Wook, The 9th International Conference on Electronic Materials and Packaging, EMAP 2007, pp.0, 123, 2007-11-19 |
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