Showing results 1 to 2 of 2
Ferroelectric Domain Wall Motion in Freestanding Single-Crystal Complex Oxide Thin Film Bakaul, Saidur R.; Kim, Jaegyu; Hong, Seungbum; Cherukara, Mathew J.; Zhou, Tao; Stan, Liliana; Serrao, Claudy R.; et al, ADVANCED MATERIALS, v.32, no.4, 2020-01 |
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
Discover