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Polarity control of ZnO films on (0001) Al2O3 by Cr-compound intermediate layers Park, JS; Hong, SK; Minegishi, T; Park, SH; Im, IH; Hanada, T; Cho, MW; et al, APPLIED PHYSICS LETTERS, v.90, no.20, pp.173 - 190, 2007-05 |
Structural and optical properties of non-polar A-plane ZnO films grown on R-plane sapphire substrates by plasma-assisted molecular-beam epitaxy Han, SK; Hong, SK; Lee, JW; Lee, JeongYong; Song, JH; Nam, YS; Chang, SK; et al, JOURNAL OF CRYSTAL GROWTH, v.309, no.2, pp.121 - 127, 2007-12 |
Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy Lee, HJ; Ha, JS; Lee, SW; Goto, H; Lee, SH; Cho, MW; Yao, T; et al, APPLIED PHYSICS LETTERS, v.91, pp.892 - 899, 2007-11 |
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