Showing results 17 to 19 of 19
Microstructural Characterization in Rotated Double-Layer Graphene Using Transmission Electron Microscopy Lee, JeongYong; Yuk, Jong Min; Jeong, HY; Lee, MJ; Kim, NY; Lee, ZH, 2013 Materials Research Society Spring Meeting, Materials Research Society, 2013-04-03 |
Raman spectroscopy study of rotated double-layer graphene: misorientation angle dependence of electronic structure Yuk, Jong Min; Kim, Kwanpyo; Coh, Sinisa; Tan, Liang Z; Regan, William; Chatterjee, Eric; Crommie, MF; et al, APS March Meeting 2012, American Physical Society, 2012-02-27 |
Raman spectroscopy study of rotated double-layer graphene: misorientation angle dependence of electronic structure Yuk, Jong Min; Kim, Kwanpyo; Coh, Sinisa; Tan, Liang Z; Regan, William; Chatterjee, Eric; Crommie, MF; et al, 2012 MRS Spring Meeting, Materials Research Society, 2012-04-09 |
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