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In-situ laser reflectometry method for wet-etch endpoint detection of VCSEL structure Cho, HK; Lee, JeongYong; Lee, B; Baek, JH; Han, WS, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.1076 - 1079, 1999-12 |
Observation of phase separation and ordering in the InAlAs epilayer grown on InP at the low temperature Cho, HK; Lee, JeongYong; Kwon, MS; Lee, B; Baek, JH; Han, WS, MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, v.64, no.3, pp.174 - 179, 1999-10 |
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