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Abnormal Thermal Instability of Al-InSnZnO Thin-Film Transistor by Hydroxyl-Induced Oxygen Vacancy at SiOx/Active Interface Jeon, Guk-Jin; Yang, Junghoon; Lee, Seung Hee; Jeong, Wooseok; Park, Sang-Hee Ko, IEEE ELECTRON DEVICE LETTERS, v.42, no.3, pp.363 - 366, 2021-03 |
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