Showing results 1 to 5 of 5
Channel Protection Layer Effect on the Performance of Oxide TFTs Park, Sang-Hee Ko; Cho, Doo-Hee; Yang, Shinhyuk; Ryu, Min Ki; Hwang, Chi-Sun; Yoon, Sung Min; Cheong, Woo-Seok; et al, ETRI JOURNAL, v.31, no.6, pp.653 - 659, 2009-12 |
Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With SiNx and SiO2 Gate Dielectrics Ji, Kwang Hwan; Kim, Ji-In; Mo, Yeon-Gon; Jeong, Jong Han; Yang, Shinhyuk; Hwang, Chi-Sun; Park, Sang-Hee Ko; et al, IEEE ELECTRON DEVICE LETTERS, v.31, no.12, pp.1404 - 1406, 2010-12 |
Device reliability under electrical stress and photo response of oxide TFTs Park, Sang-Hee Ko; Ryu, Min-Ki; Yoon, Sung-Min; Yang, Shinhyuk; Hwang, Chi-Sun; Jeon, Jae-Hong, JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, v.18, no.10, pp.779 - 788, 2010-10 |
Improved Electrical Performance and Bias Stability of Solution-Processed Active Bilayer Structure of Indium Zinc Oxide based TFT Seo, Jinsuk; Bae, Byeong-Soo, ACS APPLIED MATERIALS & INTERFACES, v.6, no.17, pp.15335 - 15343, 2014-09 |
Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors Shin, Jae-Heon; Lee, Ji-Su; Hwang, Chi-Sun; Park, Sang-Hee Ko; Cheong, Woo-Seok; Ryu, Minki; Byun, Chun-Won; et al, ETRI JOURNAL, v.31, no.1, pp.62 - 64, 2009-02 |
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