Measurement of R-values at Intermediate Strain Rates using a Digital Speckle Extensometry
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | J. Huh | ko |
| dc.contributor.author | Y.J. Kim | ko |
| dc.contributor.author | Huh, Hoon | ko |
| dc.date.accessioned | 2013-08-22T05:32:44Z | - |
| dc.date.available | 2013-08-22T05:32:44Z | - |
| dc.date.created | 2013-07-26 | - |
| dc.date.created | 2013-07-26 | - |
| dc.date.issued | 2011-06-12 | - |
| dc.identifier.citation | SEM 2011 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/176220 | - |
| dc.language | English | - |
| dc.publisher | SEM 2011 | - |
| dc.title | Measurement of R-values at Intermediate Strain Rates using a Digital Speckle Extensometry | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-84863231592 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | SEM 2011 | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Uncasville, CT, USA | - |
| dc.contributor.localauthor | Huh, Hoon | - |
| dc.contributor.nonIdAuthor | J. Huh | - |
| dc.contributor.nonIdAuthor | Y.J. Kim | - |
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- ME-Conference Papers(학술회의논문)
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