Visual inspection scheme for use in optical solder joint inspection system
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ryu Y.K. | - |
| dc.contributor.author | Cho, Hyungsuck | - |
| dc.date.accessioned | 2007-10-23T09:53:33Z | - |
| dc.date.available | 2007-10-23T09:53:33Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1996-04-22 | - |
| dc.identifier.citation | Proceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4), v.4, no., pp.3259 - 3264 | - |
| dc.identifier.issn | 1050-4729 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/1757 | - |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEEE | - |
| dc.title | Visual inspection scheme for use in optical solder joint inspection system | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-0029695232 | - |
| dc.type.rims | CONF | - |
| dc.citation.volume | 4 | - |
| dc.citation.beginningpage | 3259 | - |
| dc.citation.endingpage | 3264 | - |
| dc.citation.publicationname | Proceedings of the 1996 13th IEEE International Conference on Robotics and Automation. Part 1 (of 4) | - |
| dc.identifier.conferencecountry | United States | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Cho, Hyungsuck | - |
| dc.contributor.nonIdAuthor | Ryu Y.K. | - |
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