Showing results 1 to 5 of 5
Cross redundancy and sensitivity in DEA models Lee, Kyuseok; Choi, Kyuwan, JOURNAL OF PRODUCTIVITY ANALYSIS, v.34, pp.151 - 165, 2010-10 |
Denoising Monte Carlo sensitivity estimates Kang, Wanmo; Kim, Kyoung-Kuk; Shin, Hayong, OPERATIONS RESEARCH LETTERS, v.40, no.3, pp.195 - 202, 2012-05 |
Efficient VaR and CVaR Measurement via Stochastic Kriging Chen, Xi; Kim, Kyoung-Kuk, INFORMS JOURNAL ON COMPUTING, v.28, no.4, pp.629 - 644, 2016-09 |
FMS design model with multiple objectives using compromise programming Park, T; Lee, Heeseok; Lee, H, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.39, no.15, pp.3513 - 3528, 2001-10 |
Managing the transition of technology life cycle Kim, Bowon, TECHNOVATION, v.23, no.5, pp.371 - 381, 2003-05 |
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