A New Integrated Scan Driver using Oxide TFTs with Negative Threshold Voltage
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Huh, Jin | ko |
| dc.contributor.author | Cho, Gyu-Hyeong | ko |
| dc.date.accessioned | 2013-03-29T19:47:09Z | - |
| dc.date.available | 2013-03-29T19:47:09Z | - |
| dc.date.created | 2013-01-16 | - |
| dc.date.created | 2013-01-16 | - |
| dc.date.issued | 2012-06 | - |
| dc.identifier.citation | 2012 SID International Symposium, pp.1069 - 1072 | - |
| dc.identifier.issn | 0006-0966 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/173326 | - |
| dc.language | English | - |
| dc.publisher | Society for Information Display | - |
| dc.title | A New Integrated Scan Driver using Oxide TFTs with Negative Threshold Voltage | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-85014860563 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1069 | - |
| dc.citation.endingpage | 1072 | - |
| dc.citation.publicationname | 2012 SID International Symposium | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Boston, MA | - |
| dc.contributor.localauthor | Cho, Gyu-Hyeong | - |
| dc.contributor.nonIdAuthor | Huh, Jin | - |
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