Unsupervised Detection Of Surface Defects: A Two-Step Approach
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Jiwon | ko |
| dc.contributor.author | Kim, Changick | ko |
| dc.date.accessioned | 2013-03-29T19:14:53Z | - |
| dc.date.available | 2013-03-29T19:14:53Z | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.issued | 2012-10-02 | - |
| dc.identifier.citation | IEEE International Conference on Image Processing (ICIP), , pp.1037 - 1040 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/173121 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Unsupervised Detection Of Surface Defects: A Two-Step Approach | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000319334901029 | - |
| dc.identifier.scopusid | 2-s2.0-84875833769 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 1037 | - |
| dc.citation.endingpage | 1040 | - |
| dc.citation.publicationname | IEEE International Conference on Image Processing (ICIP), | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Orlando, Florida | - |
| dc.contributor.localauthor | Kim, Changick | - |
| dc.contributor.nonIdAuthor | Choi, Jiwon | - |
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