High-frequency TSV Failure Detection Method with Z parameter
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joohee | ko |
| dc.contributor.author | Jung, Daniel H | ko |
| dc.contributor.author | Chok, Jonghyun | ko |
| dc.contributor.author | Pak, Jun So | ko |
| dc.contributor.author | Yook, Jong Min | ko |
| dc.contributor.author | Kim, Jun Chul | ko |
| dc.contributor.author | Kim, Joungho | ko |
| dc.date.accessioned | 2013-03-29T19:07:45Z | - |
| dc.date.available | 2013-03-29T19:07:45Z | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.created | 2012-12-03 | - |
| dc.date.issued | 2012-11 | - |
| dc.identifier.citation | IEEE 38th International symposium of Test and Failure Analysis (ISTFA) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/173074 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | High-frequency TSV Failure Detection Method with Z parameter | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000322500700010 | - |
| dc.identifier.scopusid | 2-s2.0-84874302121 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE 38th International symposium of Test and Failure Analysis (ISTFA) | - |
| dc.identifier.conferencecountry | US | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Kim, Joohee | - |
| dc.contributor.nonIdAuthor | Jung, Daniel H | - |
| dc.contributor.nonIdAuthor | Chok, Jonghyun | - |
| dc.contributor.nonIdAuthor | Pak, Jun So | - |
| dc.contributor.nonIdAuthor | Yook, Jong Min | - |
| dc.contributor.nonIdAuthor | Kim, Jun Chul | - |
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