New FPN correction method for PD-storage dual-capture CMOS image sensor using a nonfully depleted pinned photodiode
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jiwon | ko |
| dc.contributor.author | Baek, Inkyu | ko |
| dc.contributor.author | Yang, Kyounghoon | ko |
| dc.date.accessioned | 2013-03-29T17:29:32Z | - |
| dc.date.available | 2013-03-29T17:29:32Z | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.created | 2012-11-29 | - |
| dc.date.issued | 2012-05 | - |
| dc.identifier.citation | IEEE International Symposium on Circuits and Systems | - |
| dc.identifier.uri | http://hdl.handle.net/10203/172494 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | New FPN correction method for PD-storage dual-capture CMOS image sensor using a nonfully depleted pinned photodiode | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000316903701208 | - |
| dc.identifier.scopusid | 2-s2.0-84866599222 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE International Symposium on Circuits and Systems | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Seoul | - |
| dc.contributor.localauthor | Yang, Kyounghoon | - |
| dc.contributor.nonIdAuthor | Lee, Jiwon | - |
| dc.contributor.nonIdAuthor | Baek, Inkyu | - |
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