Optoelectrofluidic enhancement and in situ measurement of surface-enhanced Raman scattering
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Han, D | ko |
| dc.contributor.author | Hwang, H | ko |
| dc.contributor.author | Oh, YJ | ko |
| dc.contributor.author | Cho, Y | ko |
| dc.contributor.author | Jeong, KI-HUN | ko |
| dc.contributor.author | Park, JK | ko |
| dc.date.accessioned | 2013-03-29T13:52:25Z | - |
| dc.date.available | 2013-03-29T13:52:25Z | - |
| dc.date.created | 2012-07-31 | - |
| dc.date.created | 2012-07-31 | - |
| dc.date.issued | 2011-01-01 | - |
| dc.identifier.citation | in International Symposium on Microchemistry and Microsystems (ISMM) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/171173 | - |
| dc.language | English | - |
| dc.publisher | in International Symposium on Microchemistry and Microsystems (ISMM) | - |
| dc.title | Optoelectrofluidic enhancement and in situ measurement of surface-enhanced Raman scattering | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | in International Symposium on Microchemistry and Microsystems (ISMM) | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | Seoul | - |
| dc.contributor.localauthor | Jeong, KI-HUN | - |
| dc.contributor.nonIdAuthor | Han, D | - |
| dc.contributor.nonIdAuthor | Hwang, H | - |
| dc.contributor.nonIdAuthor | Oh, YJ | - |
| dc.contributor.nonIdAuthor | Cho, Y | - |
| dc.contributor.nonIdAuthor | Park, JK | - |
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