Importance of ionized impurity scattering on resistivity of Si nanowires
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Oh, Jung Hyun | - |
| dc.contributor.author | Shin, Mincheol | - |
| dc.contributor.author | Lee, Seok-Hee | - |
| dc.date.accessioned | 2013-03-29T12:58:16Z | - |
| dc.date.available | 2013-03-29T12:58:16Z | - |
| dc.date.created | 2012-07-08 | - |
| dc.date.issued | 2012-05-24 | - |
| dc.identifier.citation | International Workshop on Computational Electronics, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/170859 | - |
| dc.language | ENG | - |
| dc.publisher | IWCE | - |
| dc.title | Importance of ionized impurity scattering on resistivity of Si nanowires | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Workshop on Computational Electronics | - |
| dc.identifier.conferencecountry | United States | - |
| dc.contributor.localauthor | Oh, Jung Hyun | - |
| dc.contributor.localauthor | Shin, Mincheol | - |
| dc.contributor.localauthor | Lee, Seok-Hee | - |
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