Dramatic increases of dielectric constant Al2O3 by very light doping of La and thermal treatment and its application to flash memory device

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dc.contributor.authorPark, JK-
dc.contributor.authorLee, Seok-Hee-
dc.contributor.authorLee, KH-
dc.contributor.authorPyi, SH-
dc.contributor.authorCho, Byung Jin-
dc.date.accessioned2013-03-29T11:59:59Z-
dc.date.available2013-03-29T11:59:59Z-
dc.date.created2012-07-08-
dc.date.issued2012-02-17-
dc.identifier.citation제 19회 한국반도체학술대회, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/170542-
dc.languageKOR-
dc.publisher고려대학교, 한국반도체산업협회,한국반도체연구조합-
dc.titleDramatic increases of dielectric constant Al2O3 by very light doping of La and thermal treatment and its application to flash memory device-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname제 19회 한국반도체학술대회-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorLee, Seok-Hee-
dc.contributor.localauthorCho, Byung Jin-
dc.contributor.nonIdAuthorPark, JK-
dc.contributor.nonIdAuthorLee, KH-
dc.contributor.nonIdAuthorPyi, SH-
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EE-Conference Papers(학술회의논문)
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