DSpace at KOASAS
College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Microstructural Analysis Upon Annealing Temperature in In-Sb-Te Thin Films Deposited by RF Magnetron Sputtering

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 334
  • Download : 0
Export
DC FieldValueLanguage
dc.contributor.authorKim ChungSoo-
dc.contributor.authorKim EunTae-
dc.contributor.authorLee JeongYong-
dc.date.accessioned2013-03-29T11:03:53Z-
dc.date.available2013-03-29T11:03:53Z-
dc.date.created2012-07-06-
dc.date.issued2010-04-07-
dc.identifier.citation2010 Materials Research Society Spring Meeting, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/170274-
dc.languageENG-
dc.titleMicrostructural Analysis Upon Annealing Temperature in In-Sb-Te Thin Films Deposited by RF Magnetron Sputtering-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2010 Materials Research Society Spring Meeting-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorLee JeongYong-
dc.contributor.nonIdAuthorKim ChungSoo-
dc.contributor.nonIdAuthorKim EunTae-
Appears in Collection
MS-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

Display Simple Item Record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


rss_1.0 rss_2.0 atom_1.0