Microstructural Analysis Upon Annealing Temperature in In-Sb-Te Thin Films Deposited by RF Magnetron Sputtering

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dc.contributor.authorKim ChungSoo-
dc.contributor.authorKim EunTae-
dc.contributor.authorLee JeongYong-
dc.date.accessioned2013-03-29T11:03:53Z-
dc.date.available2013-03-29T11:03:53Z-
dc.date.created2012-07-06-
dc.date.issued2010-04-07-
dc.identifier.citation2010 Materials Research Society Spring Meeting, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/170274-
dc.languageENG-
dc.titleMicrostructural Analysis Upon Annealing Temperature in In-Sb-Te Thin Films Deposited by RF Magnetron Sputtering-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2010 Materials Research Society Spring Meeting-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorLee JeongYong-
dc.contributor.nonIdAuthorKim ChungSoo-
dc.contributor.nonIdAuthorKim EunTae-
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MS-Conference Papers(학술회의논문)
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