Analysis of the effect of AC noise on DC bias of VGA for UHF RFID using chip-package co-modeling and simulation

Cited 1 time in webofscience Cited 0 time in scopus
  • Hit : 498
  • Download : 1293
DC FieldValueLanguage
dc.contributor.authorLee, H.ko
dc.contributor.authorShim, Y.ko
dc.contributor.authorPark, H.ko
dc.contributor.authorRyu, C.ko
dc.contributor.authorYoon, C.ko
dc.contributor.authorKim, Jounghoko
dc.date.accessioned2010-03-08T06:37:02Z-
dc.date.available2010-03-08T06:37:02Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-12-12-
dc.identifier.citation9th Electronics Packaging Technology Conference, EPTC 2007, pp.591 - 594-
dc.identifier.urihttp://hdl.handle.net/10203/17010-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleAnalysis of the effect of AC noise on DC bias of VGA for UHF RFID using chip-package co-modeling and simulation-
dc.typeConference-
dc.identifier.wosid000253874600106-
dc.identifier.scopusid2-s2.0-50049090600-
dc.type.rimsCONF-
dc.citation.beginningpage591-
dc.citation.endingpage594-
dc.citation.publicationname9th Electronics Packaging Technology Conference, EPTC 2007-
dc.identifier.conferencecountrySI-
dc.identifier.conferencelocationSingapore-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorLee, H.-
dc.contributor.nonIdAuthorShim, Y.-
dc.contributor.nonIdAuthorPark, H.-
dc.contributor.nonIdAuthorRyu, C.-
dc.contributor.nonIdAuthorYoon, C.-
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 1 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0