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Noise figure degradation analysis of power/ground noise on 900MHz LNA for UHF RFID

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Koo, K. / Park, H. / Shim, Y. / Kim, Jounghoresearcher
Publisher
IEEE
Issue Date
2007-12-12
Language
English
Citation

9th Electronics Packaging Technology Conference, EPTC 2007, pp.416 - 420

URI
http://hdl.handle.net/10203/17009
Appears in Collection
EE-Conference Papers(학술회의논문)
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