Self-reference extended depth-of-field quantitative phase microscopyJ. Jang, C. Y. Bae, J. K. Park, J. C. Ye
- Publisher
- SPIE
- Issue Date
- 2010-01
- Language
- ENG
- Citation
SPIE Conference
- Appears in Collection
- BiS-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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