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Simulation analysis for the ring patterned void defect in silicon mono crystal Lee, Sang Hun; Kang, Jeong Won; Oh, Hyun Jung; Kim, DoHyun, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp.790 - 793, IEEE, 2010-08-17 |
Vacancy behavior in Czochralski silicon growth Lee, Sang Hun; Kang, Jeong Won; Hong, Young Ho; Oh, Hyun Jung; Kim, Do Hyun, JOURNAL OF CRYSTAL GROWTH, v.311, no.14, pp.3592 - 3597, 2009-07 |
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