Showing results 1 to 1 of 1
Controlled Insertion of Planar Defect in Inverse Opals for Anticounterfeiting Applications Heo, Yongjoon; Lee, Su Yeon; Kim, Ji Won; Jeon, Tae Yoon; Kim, Shin-Hyun, ACS APPLIED MATERIALS & INTERFACES, v.9, no.49, pp.43098 - 43104, 2017-12 |
Discover