Electrokinetic microscope for imaging three-dimensional surface topography and heterogeneity

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dc.contributor.authorKwon, Gi Hwan-
dc.contributor.authorKim, Tae Young-
dc.contributor.authorKim, SungJin-
dc.date.accessioned2013-03-29T10:12:34Z-
dc.date.available2013-03-29T10:12:34Z-
dc.date.created2012-07-04-
dc.date.issued2011-11-11-
dc.identifier.citationASME 2011 international mechanical engineering congress & exposition, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/169975-
dc.languageENG-
dc.titleElectrokinetic microscope for imaging three-dimensional surface topography and heterogeneity-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameASME 2011 international mechanical engineering congress & exposition-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorKim, SungJin-
dc.contributor.nonIdAuthorKwon, Gi Hwan-
dc.contributor.nonIdAuthorKim, Tae Young-
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ME-Conference Papers(학술회의논문)
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