Characterization of on-chip Interconnections and capacitive coupling effect on CMOS operational amplifier
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shim ,Y. | - |
| dc.contributor.author | Pak, J. | - |
| dc.contributor.author | Kim, A. | - |
| dc.contributor.author | Kim, Joungho | - |
| dc.date.accessioned | 2010-03-05T01:30:17Z | - |
| dc.date.available | 2010-03-05T01:30:17Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2009-01-12 | - |
| dc.identifier.citation | 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009, v., no., pp.449 - 452 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/16963 | - |
| dc.language | ENG | - |
| dc.language.iso | en_US | en |
| dc.publisher | EMC | - |
| dc.title | Characterization of on-chip Interconnections and capacitive coupling effect on CMOS operational amplifier | - |
| dc.type | Conference | - |
| dc.identifier.scopusid | 2-s2.0-64249095585 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 449 | - |
| dc.citation.endingpage | 452 | - |
| dc.citation.publicationname | 20th International Zurich Symposium on Electromagnetic Compatibility, EMC Zurich 2009 | - |
| dc.identifier.conferencecountry | Switzerland | - |
| dc.identifier.conferencecountry | Switzerland | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Shim ,Y. | - |
| dc.contributor.nonIdAuthor | Pak, J. | - |
| dc.contributor.nonIdAuthor | Kim, A. | - |
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- EE-Conference Papers(학술회의논문)
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