Optical Charge-Pumping: A Universal Trap Characterization Technique for Nanoscale Floating Body Devices

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Publisher
IEEE
Issue Date
2011-06-16
Language
ENG
Citation

2011 Symposium on VLSI Technology, pp.190 - 191

ISSN
0743-1562
URI
http://hdl.handle.net/10203/169582
Appears in Collection
EE-Conference Papers(학술회의논문)
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