DC Field | Value | Language |
---|---|---|
dc.contributor.author | Noh, H.-K. | - |
dc.contributor.author | Ryu, B. | - |
dc.contributor.author | Choi, E.-A. | - |
dc.contributor.author | Chang, Kee-Joo | - |
dc.date.accessioned | 2013-03-29T07:08:34Z | - |
dc.date.available | 2013-03-29T07:08:34Z | - |
dc.date.created | 2012-04-06 | - |
dc.date.issued | 2011-02 | - |
dc.identifier.citation | 한국반도체학술대회, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/168627 | - |
dc.language | ENG | - |
dc.publisher | 한국반도체학회 | - |
dc.title | O-vacancy in amorphous indium-gallium-zinc oxide thin film transistors: origin of negative bias illumination stress instability | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 한국반도체학술대회 | - |
dc.contributor.localauthor | Chang, Kee-Joo | - |
dc.contributor.nonIdAuthor | Noh, H.-K. | - |
dc.contributor.nonIdAuthor | Ryu, B. | - |
dc.contributor.nonIdAuthor | Choi, E.-A. | - |
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