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College of Natural Sciences(자연과학대학)Dept. of Physics(물리학과)PH-Conference Papers(학술회의논문)

Origin of device instability in amorphous indium-gallium-zinc oxide thin film transistors

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Noh, H.-K. / Ryu, B. / Choi, E.-A. / Chang, Kee-Jooresearcher
Description
물리학과
Publisher
Materials Research Society
Issue Date
2011-04
Language
English
Citation

2011 Materials Research Society (MRS) Spring Meeting

URI
http://hdl.handle.net/10203/168587
Appears in Collection
PH-Conference Papers(학술회의논문)
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