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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

High precision surface-profile metrology by scanning the repetition rate of femtosecond pulses

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dc.contributor.authorJoo, WDko
dc.contributor.authorKim, YJko
dc.contributor.authorKim,YSko
dc.contributor.authorPark, JYko
dc.contributor.authorKim, Seung-Wooko
dc.date.accessioned2013-03-29T02:13:31Z-
dc.date.available2013-03-29T02:13:31Z-
dc.date.created2012-03-21-
dc.date.created2012-03-21-
dc.date.created2012-03-21-
dc.date.issued2011-08-21-
dc.identifier.citationSPIE 2011 Optics+Photonics-
dc.identifier.urihttp://hdl.handle.net/10203/168119-
dc.languageEnglish-
dc.publisherSPIE 2011 Optics+Photonics-
dc.titleHigh precision surface-profile metrology by scanning the repetition rate of femtosecond pulses-
dc.typeConference-
dc.identifier.wosid000297587400005-
dc.identifier.scopusid2-s2.0-80053555336-
dc.type.rimsCONF-
dc.citation.publicationnameSPIE 2011 Optics+Photonics-
dc.identifier.conferencecountryUS-
dc.contributor.localauthorKim, Seung-Woo-
dc.contributor.nonIdAuthorJoo, WD-
dc.contributor.nonIdAuthorKim, YJ-
dc.contributor.nonIdAuthorKim,YS-
dc.contributor.nonIdAuthorPark, JY-
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ME-Conference Papers(학술회의논문)
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