Characterization of ultra-high risk for psychosis based on topological properties of neural networks

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dc.contributor.authorJang, JH-
dc.contributor.authorJhung, K-
dc.contributor.authorShin, D-
dc.contributor.authorPark. JY-
dc.contributor.authorAn, SK-
dc.contributor.authorCho, Kwang-Hyun-
dc.date.accessioned2013-03-28T12:52:55Z-
dc.date.available2013-03-28T12:52:55Z-
dc.date.created2012-02-06-
dc.date.issued2011-02-11-
dc.identifier.citationThe 2nd Asian Congress on Schizophrenia Research, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/165853-
dc.languageENG-
dc.titleCharacterization of ultra-high risk for psychosis based on topological properties of neural networks-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameThe 2nd Asian Congress on Schizophrenia Research-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorCho, Kwang-Hyun-
dc.contributor.nonIdAuthorJang, JH-
dc.contributor.nonIdAuthorJhung, K-
dc.contributor.nonIdAuthorShin, D-
dc.contributor.nonIdAuthorPark. JY-
dc.contributor.nonIdAuthorAn, SK-
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BiS-Conference Papers(학술회의논문)
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