Characterization of Electrical Conductivity and Interfacial Microstructure of Ag/Cu Composite
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hong, Soon-Hyung | - |
| dc.date.accessioned | 2013-03-28T12:52:26Z | - |
| dc.date.available | 2013-03-28T12:52:26Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2011-04-21 | - |
| dc.identifier.citation | 춘계금속재료학회, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/165851 | - |
| dc.language | KOR | - |
| dc.publisher | 금속재료학회 | - |
| dc.title | Characterization of Electrical Conductivity and Interfacial Microstructure of Ag/Cu Composite | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 춘계금속재료학회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Hong, Soon-Hyung | - |
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