Probing nanomechanical and charge transport properties on graphene layer with atomic force microscopy
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 권상구 | - |
| dc.contributor.author | 최성현 | - |
| dc.contributor.author | 정현종 | - |
| dc.contributor.author | 박정영 | - |
| dc.date.accessioned | 2013-03-28T12:18:54Z | - |
| dc.date.available | 2013-03-28T12:18:54Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2010-10-05 | - |
| dc.identifier.citation | 5th International Symposium on Practical Surface Analysis, v., no., pp.214 - 214 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/165648 | - |
| dc.language | ENG | - |
| dc.title | Probing nanomechanical and charge transport properties on graphene layer with atomic force microscopy | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 214 | - |
| dc.citation.endingpage | 214 | - |
| dc.citation.publicationname | 5th International Symposium on Practical Surface Analysis | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | 박정영 | - |
| dc.contributor.nonIdAuthor | 권상구 | - |
| dc.contributor.nonIdAuthor | 최성현 | - |
| dc.contributor.nonIdAuthor | 정현종 | - |
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