DC Field | Value | Language |
---|---|---|
dc.contributor.author | Baik, S.J. | ko |
dc.contributor.author | Lim, Koeng Su | ko |
dc.contributor.author | Choi, W. | ko |
dc.contributor.author | Yoo, H. | ko |
dc.contributor.author | Shin, H. | ko |
dc.date.accessioned | 2013-03-28T08:55:43Z | - |
dc.date.available | 2013-03-28T08:55:43Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2011-04-10 | - |
dc.identifier.citation | 49th International Reliability Physics Symposium, IRPS 2011 | - |
dc.identifier.issn | 1541-7026 | - |
dc.identifier.uri | http://hdl.handle.net/10203/164303 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Charge diffusion in silicon nitrides: Scalability assessment of nitride based flash memory | - |
dc.type | Conference | - |
dc.identifier.wosid | 000295322100108 | - |
dc.identifier.scopusid | 2-s2.0-79959310057 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 49th International Reliability Physics Symposium, IRPS 2011 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Monterey, CA | - |
dc.contributor.localauthor | Lim, Koeng Su | - |
dc.contributor.nonIdAuthor | Baik, S.J. | - |
dc.contributor.nonIdAuthor | Choi, W. | - |
dc.contributor.nonIdAuthor | Yoo, H. | - |
dc.contributor.nonIdAuthor | Shin, H. | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.