Modeling and measurement of board-level ESD from power/ground plane charged by low-voltage for investigation of decoupling capacitor effects in Printed Circuit Boards (PCBs)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Sung, H. | ko |
| dc.contributor.author | Kim, M. | ko |
| dc.contributor.author | Lee, W. | ko |
| dc.contributor.author | Yoon, C. | ko |
| dc.contributor.author | Koo, K. | ko |
| dc.contributor.author | Kwon, J. | ko |
| dc.contributor.author | Kim, Joungho | ko |
| dc.date.accessioned | 2013-03-28T07:40:57Z | - |
| dc.date.available | 2013-03-28T07:40:57Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2010-12-08 | - |
| dc.identifier.citation | 12th Electronics Packaging Technology Conference, EPTC 2010, pp.773 - 776 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/163894 | - |
| dc.language | English | - |
| dc.publisher | EPTC 2010 | - |
| dc.title | Modeling and measurement of board-level ESD from power/ground plane charged by low-voltage for investigation of decoupling capacitor effects in Printed Circuit Boards (PCBs) | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000406946800158 | - |
| dc.identifier.scopusid | 2-s2.0-79951866322 | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 773 | - |
| dc.citation.endingpage | 776 | - |
| dc.citation.publicationname | 12th Electronics Packaging Technology Conference, EPTC 2010 | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | Singapore | - |
| dc.contributor.localauthor | Kim, Joungho | - |
| dc.contributor.nonIdAuthor | Sung, H. | - |
| dc.contributor.nonIdAuthor | Kim, M. | - |
| dc.contributor.nonIdAuthor | Lee, W. | - |
| dc.contributor.nonIdAuthor | Yoon, C. | - |
| dc.contributor.nonIdAuthor | Koo, K. | - |
| dc.contributor.nonIdAuthor | Kwon, J. | - |
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