DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeong, Hu Young | ko |
dc.contributor.author | Choi, Sung-Yool | ko |
dc.contributor.author | Lee, Jeong Yong | ko |
dc.date.accessioned | 2013-03-28T07:36:32Z | - |
dc.date.available | 2013-03-28T07:36:32Z | - |
dc.date.created | 2012-12-01 | - |
dc.date.created | 2012-12-01 | - |
dc.date.issued | 2008-11-06 | - |
dc.identifier.citation | 2008 International Conference on Nano Science and Nano Technology | - |
dc.identifier.uri | http://hdl.handle.net/10203/163878 | - |
dc.language | English | - |
dc.publisher | 2008 International Conference on Nano Science and Nano Technology | - |
dc.title | Top Electrode Dependence on Resistive Swichng Properties of Metal/TiOx/Al Memory Devices | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2008 International Conference on Nano Science and Nano Technology | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Gwangju | - |
dc.contributor.localauthor | Choi, Sung-Yool | - |
dc.contributor.nonIdAuthor | Jeong, Hu Young | - |
dc.contributor.nonIdAuthor | Lee, Jeong Yong | - |
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