Analytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes

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dc.contributor.authorJeong, Hu Young-
dc.contributor.authorRyu, Min Ki-
dc.contributor.authorChoi, Sung-Yool-
dc.contributor.authorLee, Jeong Yong-
dc.date.accessioned2013-03-28T07:35:06Z-
dc.date.available2013-03-28T07:35:06Z-
dc.date.created2012-12-01-
dc.date.issued2007-04-09-
dc.identifier.citationMRS Spring Meetings & Exhibits, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/163874-
dc.languageENG-
dc.publisherMRS-
dc.titleAnalytical Transmission Electron Microscopy Study on the Oxygen Defect Formation of Ti Oxide Thin Films Sandwiched between Al Electrodes-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameMRS Spring Meetings & Exhibits-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorChoi, Sung-Yool-
dc.contributor.nonIdAuthorJeong, Hu Young-
dc.contributor.nonIdAuthorRyu, Min Ki-
dc.contributor.nonIdAuthorLee, Jeong Yong-
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EE-Conference Papers(학술회의논문)
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