DC Field | Value | Language |
---|---|---|
dc.contributor.author | Cho, Hyungsuck | ko |
dc.contributor.author | Park W.S. | ko |
dc.date.accessioned | 2007-10-04T02:33:19Z | - |
dc.date.available | 2007-10-04T02:33:19Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2002-07-09 | - |
dc.identifier.citation | Algorithms and Systems for Optical Information Processing VI, pp.224 - 236 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | http://hdl.handle.net/10203/1622 | - |
dc.description | Copyright 2002 Society of Photo-Optical Instrumentation Engineers. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | International Society for Optical Engineering (SPIE) | - |
dc.title | Neural network applications in automated optical inspection: State of the arts | - |
dc.type | Conference | - |
dc.identifier.wosid | 000179997600023 | - |
dc.identifier.scopusid | 2-s2.0-0036986710 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 224 | - |
dc.citation.endingpage | 236 | - |
dc.citation.publicationname | Algorithms and Systems for Optical Information Processing VI | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Seattle, WA | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Cho, Hyungsuck | - |
dc.contributor.nonIdAuthor | Park W.S. | - |
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