DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.date.accessioned | 2013-03-27T10:29:35Z | - |
dc.date.available | 2013-03-27T10:29:35Z | - |
dc.date.created | 2012-03-21 | - |
dc.date.issued | 2007-02 | - |
dc.identifier.citation | KAIST-TIT Student Workshop, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/161659 | - |
dc.language | ENG | - |
dc.publisher | KAIST-TIT Student Workshop | - |
dc.title | PRECISE MEASUREMENT OF REFRACTIVE INDEX AND THE THICKNESS OF A MATERIAL BY DISPERSIVE INTERFEROMETRY USING A FEMTOSECOND PULSE LASER | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | KAIST-TIT Student Workshop | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
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