Fabrication and characterization of SiOx/Parylene and SiNx/Parylene thin film encapsulation layers

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Issue Date
2007-07-08
Language
ENG
Citation

ASME Electronic and Photonics Packaging Division, pp.933 - 938

URI
http://hdl.handle.net/10203/161470
Appears in Collection
EE-Conference Papers(학술회의논문)
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