박막의 두께형상 및 굴절률 측정Thin-film Measurements of thickness profile and refractive index

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dc.contributor.author주우덕-
dc.contributor.author김영식-
dc.contributor.author유준호-
dc.contributor.author김승우-
dc.date.accessioned2013-03-27T09:11:24Z-
dc.date.available2013-03-27T09:11:24Z-
dc.date.created2012-03-21-
dc.date.issued2007-11-
dc.identifier.citation한국정밀공학회 2007년도 추계학술대회 , v., no., pp.41 - 42-
dc.identifier.urihttp://hdl.handle.net/10203/161140-
dc.languageKOR-
dc.publisher한국정밀공학회-
dc.title박막의 두께형상 및 굴절률 측정-
dc.title.alternativeThin-film Measurements of thickness profile and refractive index-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage41-
dc.citation.endingpage42-
dc.citation.publicationname한국정밀공학회 2007년도 추계학술대회-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthor김승우-
dc.contributor.nonIdAuthor주우덕-
dc.contributor.nonIdAuthor김영식-
dc.contributor.nonIdAuthor유준호-
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ME-Conference Papers(학술회의논문)
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