DC Field | Value | Language |
---|---|---|
dc.contributor.author | 주우덕 | - |
dc.contributor.author | 김승우 | - |
dc.date.accessioned | 2013-03-27T09:08:01Z | - |
dc.date.available | 2013-03-27T09:08:01Z | - |
dc.date.created | 2012-03-21 | - |
dc.date.issued | 2008-11-13 | - |
dc.identifier.citation | 한국정밀공학회 2008년도 추계학술대회 , v.8, no., pp.109 - 110 | - |
dc.identifier.uri | http://hdl.handle.net/10203/161119 | - |
dc.language | KOR | - |
dc.publisher | 한국정밀공학회 | - |
dc.title | 반사광측정법을 이용한 박막의 두께 및 굴절률 측정방법 | - |
dc.title.alternative | Simultaneous measurements of refractive index and thickness of a thin-film layer using reflectometry | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.volume | 8 | - |
dc.citation.beginningpage | 109 | - |
dc.citation.endingpage | 110 | - |
dc.citation.publicationname | 한국정밀공학회 2008년도 추계학술대회 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | 김승우 | - |
dc.contributor.nonIdAuthor | 주우덕 | - |
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