Optimal Design of Accelerated Life Tests under Cyclic-Stress Loading: The Case of Lognormal Lifetime Distribution

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dc.contributor.authorYum, Bong-Jin-
dc.contributor.authorKim, SH-
dc.date.accessioned2013-03-27T08:52:36Z-
dc.date.available2013-03-27T08:52:36Z-
dc.date.created2012-02-06-
dc.date.issued2009-
dc.identifier.citationAPIEMS 2009, v., no., pp.1570 - 1577-
dc.identifier.urihttp://hdl.handle.net/10203/161017-
dc.languageENG-
dc.titleOptimal Design of Accelerated Life Tests under Cyclic-Stress Loading: The Case of Lognormal Lifetime Distribution-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage1570-
dc.citation.endingpage1577-
dc.citation.publicationnameAPIEMS 2009-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorYum, Bong-Jin-
dc.contributor.nonIdAuthorKim, SH-
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IE-Conference Papers(학술회의논문)
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